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  • Characteristics, Test and Application
    Yuan Gao; Yan Zhang
    978-981-96-3480-4
    2025
    Edition 1
    • Introduces the latest development status of silicon carbide device industry in detail
    • Analyzes the technical challenges in the application of SiC devices with solutions proposed
    • Provides large number of high practical value test data and waveforms

    €300

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