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  • Rongming Wang; Chen Wang; Hongzhou Zhang; Jing Tao; Xuedong Bai
    978-981-13-0454-5
    2018
    Edition 1
    • Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research
    • Showcases recent advances in scanning electron microscopy, transmission electron microscopy, and helium ion microscopy
    • Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques

    €220

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