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  • Jiann-Shiun Yuan
    978-981-10-0884-9
    2016
    Edition 1
    • First book to address the effect of device reliability and process variations on the RF circuit performance degradations
    • Present of all kinds RF circuits in the reliability examination
    • Includes analytical equations, experimental data and simulation results
    • Includes supplementary material: sn.pub/extras

    €100

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