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Probing the traps in field-effect transistorsSeongil Im; Youn-Gyoung Chang; Jae Hoon Kim978-94-007-6392-02013 Edition 1- New and easy method to quantitatively measure the trap density of state in FETs as a measure of device instability are included
- New and easy method to characterize the electronic structure of organic semiconductor are described
- Method to measure the interface traps of nanostructure FETs included in the book
€90 €8110% OFF