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  • Gustavo Neuberger; Gilson Wirth; Ricardo Reis
    978-94-007-2427-3
    2014
    Edition 1
    • Presents a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology
    • Studies the consequences of variability in several aspects of circuit design
    • Focuses specifically on the effects of storage elements on circuit design
    • Includes supplementary material: sn.pub/extras

    €180

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