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  • Peter Pichler
    978-3-7091-0597-9
    2004
    Edition 1
    • First comprehensive review of intrinsic point defects and impurities in silicon
    • Compiles all known information about structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behavior of intrinsic point defects, acceptor and donor impurities, isovalent impurities, chalcogens, and halogens

    €578

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