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  • Atomic Force Microscopy and Scanning Tunneling Microscopy
    Bert Voigtländer
    978-3-662-45240-0
    2015
    Edition 1
    • Presents the state-of-the-art in scanning probe techniques
    • Combines basic physical principles and their application to scanning tunneling and atomic force microscopes
    • Useful study text for graduate students and also useful reference to researchers
    • Includes supplementary material: sn.pub/extras

    €400

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