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  • Jian Zhang; Zhiqiang Zhang; Feifei Ma
    978-3-662-43429-1
    2014
    Edition 1
    • Reviews the state-of-the-art of automatic data generation methods for combinatorial testing
    • Presents step-by-step procedures for important algorithms of automatic data generation
    • Introduces exhaustively the key techniques for test data generation, including evolutionary computation, constraint solving and optimization
    • Covers recent hot topics like fault localization, test case prioritization
    • Includes supplementary material: sn.pub/extras

    €100

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