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  • Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
    A. Benninghoven; C.A. Jr. Evans; R.A. Powell; R. Shimizu; H.A. Storms
    978-3-642-61871-0
    1979
    Edition 1

    €180

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