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  • Across Spatial and Temporal Scales
    Alexander Ziegler; Heinz Graafsma; Xiao Feng Zhang; Joost W.M. Frenken
    978-3-642-45152-2
    2014
    Edition 1
    • Scientific status report on analytical techniques in nano-and surface sciences
    • Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy
    • Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering
    • Includes supplementary material: sn.pub/extras
    €180 €162
    10% OFF

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