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  • Nano-Characterization and Coherent Control
    Ken-ichi Shudo; Ikufumui Katayama; Shin-Ya Ohno
    978-3-642-40594-5
    2014
    Edition 1
    • Gives a survey of advanced methods in current optical measurements
    • Reviews the most up-to-date topics in an introductory way
    • Numerous references to the original works help students and newcomers to enter the field
    • Includes supplementary material: sn.pub/extras

    €180

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