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  • A Fundamental Study Aimed at Non-Destructive Carrier Profiling in Silicon
    Janusz Bogdanowicz
    978-3-642-30108-7
    2012
    Edition 1
    • Selected as an outstanding contribution by K.U. Leuven
    • Reports significant advances in non-destructive testing of semiconductors
    • New approaches have potential for industrial application
    • Includes supplementary material: sn.pub/extras

    €180

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