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  • Brent Fultz; James Howe
    978-3-642-29761-8
    2013
    Edition 4
    • New edition of successful, well-reviewed textbook
    • Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry
    • Shows how wave radiation probes the structure of materials
    • Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications
    • Explains the mathematics needed consistently through the book
    • Helps to extend knowledge by indicating further reading
    • Explains concepts in detail, with no requirement for different reference materials
    • Includes supplementary material: sn.pub/extras

    €419

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