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  • Bharat Bhushan
    978-3-642-03535-7
    2010
    Edition 1
    • Scientific reviews on scanning tunneling microscopy and atomic force microscopy
    • Integrates basic scientific and applicational aspects
    • With a foreword by the co-inventor of AFM, Christoph Gerber
    • Useful reference to researchers and graduate students
    €538 €484
    10% OFF

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