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  • Basics and Use for Evaluating Electronic Devices and Materials
    Otwin Breitenstein; Wilhelm Warta; Martin Langenkamp
    978-3-642-02417-7
    2010
    Edition 2
    • Only book in the market on this highly sensitive infrared measurement method
    • Explains the basics and applications of this analytical technique
    • A reference work for researchers and engineers alike
    • Includes supplementary material: sn.pub/extras

    €180

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