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  • Characterization by Atomic Force Microscopy
    K. C. Khulbe; C. Y. Feng; Takeshi Matsuura
    978-3-540-73994-4
    2008
    Edition 1
    • First book which combines both fields AFM and Synthetic Membranes
    • Will provide a very useful guide to the readers who wish to enter the subject of the book
    • Gives details of AFM experimental methods and interpretation of experimental data
    • Includes supplementary material: sn.pub/extras

    €180

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