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  • Time-To-Failure Modeling
    J. W. McPherson
    978-3-319-93683-3
    2019
    Edition 3
    • Provides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications;
    • Explains the fundamentals of reliability physics and engineering tools for building better products;
    • Contains statistical training and tools within the text;
    • Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.

    €419

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