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  • From Single Charge Detection to Device Characterization
    Sascha Sadewasser; Thilo Glatzel
    978-3-319-75687-5
    2018
    Edition 1
    • Discusses the applications of Kelvin probe force microscopy in nanotechnology
    • Provides a detailed description of a variety of theoretical and experimental aspects of the technique
    • Includes contributions by leading experts in the field

    €419

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