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  • Jens Lienig; Matthias Thiele
    978-3-319-73558-0
    2018
    Edition 1
    • Enables readers to understand and meet challenges of electromigration, including its effects on the reliability of electronic systems
    • Accessible to readers of varying backgrounds and experience levels, combining practical application with theoretical underpinnings
    • Extensive use of multi-color illustrations, for rapid and clear understanding
    • Multiple examples and hands-on instructions for the practical application of counter measures
    • Includes supplementary material: sn.pub/extras

    €170

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