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Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals

A Scanning Probe Microscopy Approach

Nicholas D. Kay

978-3-319-70181-3

2018
Edition 1
- Nominated as an outstanding Ph.D.thesis by Lancaster University and University of Manchester, UK
- Includes high-resolution computer-generated imagery (CGI) and diagrams to aid understanding and visualization of the research
- Presents the unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials
- Offers an in-depth theoretical analysis backed up with experimental data for a comprehensive overview of the current state of the art in applying scanning probe microscopy to study 2D materials
- Includes supplementary material: sn.pub/extras
€180

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