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  • Richard Fujimoto; Conrad Bock; Wei Chen; Ernest Page; Jitesh H. Panchal
    978-3-319-58544-4
    2017
    Edition 1
    • Outlines key research challenges in areas of conceptual models, computational issues, uncertainty, and reuse of models and simulations
    • Presents perspectives from experts in these areas
    • Considers important applications, such as manufacturing, health care, aerospace, sustainability and urban growth, and defense
    • Includes supplementary material: sn.pub/extras
    • Includes supplementary material: sn.pub/extras

    €180

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