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  • eBook: VLSI-SoC: Design for Reliability, Security, and Low Power
    23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
    Youngsoo Shin; Chi Ying Tsui; Jae-Joon Kim; Kiyoung Choi; Ricardo Reis
    978-3-319-46097-0
    2016
    Edition 1
    €100 €90
    10% OFF

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