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  • Problem Analysis, Metrics and Techniques
    Francisco Herrera; Francisco Charte; Antonio J. Rivera; María J. del Jesus
    978-3-319-41111-8
    2016
    Edition 1
    • Covers key concepts of multilabel data characterization, treatment, and evaluation
    • Equips the reader with all the software tools needed to handle multilabel data, including step-by-step instructions for use
    • Provides the perfect guide for beginners and practitioners with interest in the topic, as well as experts seeking a comprehensive overview
    • Includes supplementary material: sn.pub/extras

    €180

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