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Physical Principles of Electron Microscopy

An Introduction to TEM, SEM, and AEM

R.F. Egerton

978-3-319-39877-8

2016
Edition 2
- Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy
- Contains expanded reference lists as a launch point into the specialist literature
- Requires only a first-year undergraduate knowledge of physics
- Written by a leading author who received the 2004 Distinguished Physical Scientist Award of the Microscopical Society of America
- Covers principles and techniques essential to materials science, the semiconductor industry, nanotechnology, and the biomedical and forensic sciences
- Includes supplementary material: sn.pub/extras
€419 €377
10% OFF

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