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Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

C. Barry Carter; David B. Williams

978-3-319-26651-0

2016
Edition 1
- An essential companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter
- Equips the reader with a clear and deep understanding of TEM, the essential tool for studying nanomaterials
- Presents advanced topics with the same look, feel, and approach that students already know from Williams & Carter
- Features chapters on diffraction, high-resolution imaging, and chemical mapping by the leading experts in the field
- Provides the fundamentals for students to understand and interpret the results of electron tomography and electron holography, even if they will not employ these techniques themselves
- Includes supplementary material: sn.pub/extras
€419

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