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  • Peter Jan Van Leeuwen; Yuan Cheng; Sebastian Reich
    978-3-319-18347-3
    2015
    Edition 1
    • Consists of two contributions by leading experts in the field
    • Provides a proper introduction of localization in particle filters, which is lacking in current literature
    • Gives insight to sophisticated numerical techniques
    • Includes supplementary material: sn.pub/extras
    €80 €72
    10% OFF

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