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  • Qiang Cui; Juin J. Liou; Jean-Jacques Hajjar; Javier Salcedo; Yuanzhong Zhou; Parthasarathy Srivatsan
    978-3-319-10819-3
    2015
    Edition 1
    • Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies
    • Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS)
    • Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance
    • Includes supplementary material: sn.pub/extras
    €166 €149
    10% OFF

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