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Hot Carrier Degradation in Semiconductor Devices

Tibor Grasser

978-3-319-08994-2

2015
Edition 1
- Describes the intricacies of hot carrier degradation in modern semiconductor technologies
- Covers the entire hot carrier degradation phenomenon, including topics such as characterization, carrier transport, carrier-defect interaction, technological impact, circuit impact, etc
- Enables detailed understanding of carrier transport, interaction of the carrier ensemble with the defect precursors, and an accurate assessment of how the newly created defects impact the device performance
- Covers modeling issues starting from detailed physics-based TCAD approaches up to efficient SPICE-compatible compact models
- Includes supplementary material: sn.pub/extras
€200

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