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  • Xiao Liu; Qiang Xu
    978-3-319-00533-1
    2014
    Edition 1
    • Provides a comprehensive summary of state-of-the-art on post-silicon validation
    • Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer
    • Illustrate key concepts and algorithms with real examples
    • Includes supplementary material: sn.pub/extras
    €180 €162
    10% OFF

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