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  • Hakan Kuntman; Deniz Özenli; Fırat Kaçar; Yasin Özçelep
    978-3-031-85455-2
    2025
    Edition 1
    • Presents recent advances in statistical method based reliability estimation of MOS transistors
    • Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented
    • Discusses design examples for specific application areas, enabling readers to follow recent advances and trends

    €180

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