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Single-Event Effects, from Space to Accelerator Environments

Analysis, Prediction and Hardening by Design

Ygor Quadros de Aguiar; Frédéric Wrobel; Jean-Luc Autran; Rubén García Alía

978-3-031-71723-9

2025
Edition 1
- Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies
- Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies
- Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels
- Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
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