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  • Contributions from the European ECSEL JU project iRel40
    Willem Dirk van Driel; Klaus Pressel; Mujdat Soyturk
    978-3-031-59361-1
    2024
    Edition 1
    • Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices
    • Discusses how to correlate electronic processing and performance to reliability and lifetime
    • Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices

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