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  • Patrick Girard; Shawn Blanton; Li-C. Wang
    978-3-031-19639-3
    2023
    Edition 1
    • Identifies the key challenges in fault diagnosis of system-on-chip and presents the solutions
    • Demonstrates techniques based on industrial data and feedback from actual PFA analysis
    • Discusses practical problems, including test sequence quality, diagnosis resolution, accuracy, time cost, etc
    €120 €108
    10% OFF

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