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  • Mohsen Raji; Behnam Ghavami
    978-3-031-15345-7
    2023
    Edition 1
    • Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits
    • Describes state-of-the art aging- and process variation-aware CAD algorithms
    • Includes reliability improvement techniques for common clocked storage element

    €170

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