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  • Keith A. Jenkins
    978-3-030-77775-3
    2022
    Edition 1
    • Describes an arsenal of dynamic, RF and time-domain techniques to understand and characterize the behavior of novel transistors made of graphene, carbon nanotubes and silicon-on-insulator, and using new transistor structrures
    • Explains the importance of using RF and time-domain measurements and the relationship of such measurement results to DC transistor characteristics
    • Covers practical aspects of using the measurement techniques described
    • Discusses the inter-relationship of the various methods presented

    €130

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