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Design for Testability, Debug and Reliability

Next Generation Measures Using Formal Techniques

Sebastian Huhn; Rolf Drechsler

978-3-030-69209-4

2021
Edition 1
- Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs
- Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework
- Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats
- Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications
€200

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