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Alexandra Zimpeck; Cristina Meinhardt; Laurent Artola; Ricardo Reis978-3-030-68368-92021 Edition 1- Explains how to measure the influence of process variability (e.g. work-function fluctuations) and radiation-induced soft errors in FinFET logic cells
- Enables designers to improve the robustness of FinFET integrated circuits without focusing on manufacturing adjustments
- Discusses the benefits and downsides of using circuit-level approaches such as transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor for mitigating the impact of process variability and soft errors
- Evaluates the techniques described in the context of different test scenarios: distinct levels of process variations, transistor sizing, and different radiation features
- Helps readers identify the best circuit design considering the target application and design requirements like area constraints or power/delay limitations
€140 €12610% OFF