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  • Earl J. Kirkland
    978-3-030-33260-0
    2020
    Edition 3
    • Features in-depth coverage of numerical computation of electron microscopy images including multislice methods
    • Covers high resolution CTEM and STEM image interpretation
    • Addresses the latest developments in the field from the last decade
    • Includes updated appendices with code in Octave
    • Allows you to calculate images from first principles for specimens ranging from simple inorganic crystals to cryo-EM biological specimens

    €340

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