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  • Rodrigo Possamai Bastos; Frank Sill Torres
    978-3-030-29353-6
    2020
    Edition 1
    • Presents a unique approach for detection of radiation-induced transient faults in integrated circuits
    • Describes the effects of ionizing particles in the transistor body and discusses its exploitation
    • Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications
    €114 €103
    10% OFF

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