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  • Ibrahim (Abe) M. Elfadel; Duane S. Boning; Xin Li
    978-3-030-04666-8
    2019
    Edition 1
    • Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability
    • Discusses the use of machine learning techniques in the context of analog and digital synthesis
    • Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions
    • Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs

    €380

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