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  • Stability and Reliability
    Daniel Adams; Terry L. Alford; James W. Mayer
    978-1-84800-027-8
    2008
    Edition 1
    • First book to discuss current knowledge of silver metallization and its potential as a favourable candidate for implementation as a future interconnect material for integrated circuit technology
    • Valuable resource in this emerging field
    • Provides detailed information on a wide range of experimental characterization and analysis techniques
    • Includes supplementary material: sn.pub/extras

    €180

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