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  • eBook:Scanning Electron Microscopy and X-Ray Microanalysis

    Scanning Electron Microscopy and X-Ray Microanalysis

    Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
    978-1-4939-6676-9
    2018
    Edition 4
    • Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers
    • Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results
    • Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements
    • Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation
    • Includes case studies to illustrate practical problem solving
    • Covers Helium ion scanning microscopy
    • Organized into relatively self-contained modules – no need to 'read it all' to understand a topic

    €419

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