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  • eBook:Advanced Transmission Electron Microscopy

    Advanced Transmission Electron Microscopy

    Imaging and Diffraction in Nanoscience
    Jian Min Zuo; John C.H. Spence
    978-1-4939-6607-3
    2017
    Edition 1
    • Serves as an expanded and thoroughly updated successor to the authors’ 1992 “Electron Microdiffraction,” the leading text in the field
    • Improves on previous coverage of electron wave properties and electron diffraction theory in addition to many new chapters in such areas as strain-field analysis and electron detectors
    • Offers comprehensive, quantitative treatments of crystal symmetry, crystal structure and bonding, diffuse scattering, strain measurements, defects and nanostructure characterization
    • Provides new coverage of electron optics, principles of aberration correction and energy filters, electron nanodiffraction techniques, and TEM and STEM imaging theory
    • Presents the latest information on nanostructure analysis, emphasizing quantitative analysis of images and diffraction patterns
    • Includes numerous tables and figures for electron crystallography, and source listings of simulation and modeling computer programs
    • Includes supplementary material: sn.pub/extras

    €419

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