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CMOS Test and Evaluation

A Physical Perspective

Manjul Bhushan; Mark B. Ketchen

978-1-4939-1349-7

2015
Edition 1
- Relates CMOS product performance to basic physical models of transistors and passive elements
- Uses embedded test structures and sensors for product test debug, yield and performance evaluation
- Describes impact of device variability
- Discusses application corners, schmooing and product specifications including guardbands
- Presents an overall view of CMOS product chip test, test equipment and diagnostic tools
- Describes data analysis techniques for rapid evaluation and debug during test
- Features nearly 300 illustrations
- Includes supplementary material: sn.pub/extras
- Request lecturer material: sn.pub/lecturer-material
€240 €216
10% OFF

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