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  • Third Edition
    Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J.R. Michael
    978-1-4615-0215-9
    2003
    Edition 3
    • The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globe
    • The authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis
    €419 €377
    10% OFF

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