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  • Osamu Ueda; Stephen J. Pearton
    978-1-4614-4337-7
    2013
    Edition 1
    • Provides the first handbook to cover all aspects of compound semiconductor device reliability
    • Systematically describes research results on reliability and materials issues of both optical and electron devices developed since 2000
    • Covers characterization techniques needed to understand failure mechanisms in compound semiconductor devices
    • Includes experimental approaches in reliability studies
    • Presents case studies of laser degradation and HEMT degradation

    €578

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