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  • Ricardo Reis; Yu Cao; Gilson Wirth
    978-1-4614-4078-9
    2015
    Edition 1
    • Provides comprehensive review on various reliability mechanisms at sub-45nm nodes
    • Describes practical modeling and characterization techniques for reliability
    • Includes thorough presentation of robust design techniques for major VLSI design units
    • Promotes physical understanding with first-principle simulations
    • Includes supplementary material: sn.pub/extras
    €180 €162
    10% OFF

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