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  • Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer
    978-1-4614-3436-8
    2012
    Edition 1
    • Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
    • Presents a detailed description of the analysis tools
    • Includes practical examples of how the technique can be used in materials science research
    • Stands as a must-have reference for any user of atom probe microscopy
    • Includes supplementary material: sn.pub/extras

    €479

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