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  • Thermal and Electrical Stability
    Ming He; Toh-Ming Lu
    978-1-4614-1812-2
    2012
    Edition 1
    • Presents a unified approach to understanding the diverse phenomena observed at metal-dielectric interfaces
    • Features fundamental considerations in the physics and chemistry of metal-dielectric interactions
    • Explores mechanisms of metal atom diffusion and metal ion drift in dielectrics
    • Provides keys to understanding reliability in gigascale electronics
    • Focuses on a dynamic area of current research that is a foundation of future interconnect systems, memristors, and solid-state electrolyte devices
    • Includes supplementary material: sn.pub/extras
    €180 €162
    10% OFF

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