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  • Allyson L. Hartzell; Mark G. da Silva; Herbert R. Shea
    978-1-4419-6018-4
    2011
    Edition 1
    • Demonstrates how to design MEMs for reliability during the product life cycle focusing CAD methodologies and system level architecture
    • Provides detailed information on the different types of failure modes, including but not limited to, design failures, manufacturing failures, and material failure, and how to avoid them
    • Discusses testing, qualification, processes and procedures for MEMs reliability and the specific tests for enhancing reliability
    • Includes supplementary material: sn.pub/extras

    €220

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